Integrating Error Level Analysis and Sensor Pattern Noise for image forgery detection
Date of Submission
17th Jan 2025
General Information:
|
| Year Of Paper Submission : 2024-25 |
| Type of Applicant : Research Scholar |
| Selected Course : PhD |
| Department of Applicant : COMPS |
| Class of Applicant : Research Scholar |
Applicants Details:
|
| Applicant Name : Divya Prathamesh Surve |
| Applicant Email : divya.surve@spit.ac.in |
| Applicant Contact Number : 9975672424 |
Guide Details:
|
| Department of Guide No. 1 : Computer Engineering |
| Name of First Guide : Dr. Anant V. Nimkar |
Paper Details:
|
| Title of Paper : Integrating Error Level Analysis and Sensor Pattern Noise for image forgery detection |
| Type of Paper : international |
| Type of Publication : international |
| Name of the Conference/journal/publisher :
IEEE International Conference on Intelligent Signal Processing and Effective Communication Technologies |
| Date Of Conference / Journal / Book :
2024-12-08 |
| Conference_Type : ieee |
| Name of the Hosting Institute of the Conference :
ABV Indian Institute of Information Technology and Management |
| Address of Host Institute : Morena Link Road, Gwalior, Madhya Pradesh, India, 474015 |
